With our compact and practice-oriented seminars, we provide an optimal introduction to the complex world of reliability technology and test planning in advance. You will have the unique opportunity to acquire in-depth knowledge of all aspects of reliability technology
Seminars in reliability management
and testing and to apply this to individual problems. For this purpose we offer three basic seminars, all of which are certified by the University of Stuttgart:
Reliability & testing for practitioners
Get to know the basics of reliability technology in a practical way. Based on the basics of statistical distribution functions, we show which steps are required for a service life analysis and give tips and tricks for typical problems that arise in practice. In more depth, the participants will learn how reliability goals can be defined and proven. For this purpose, various test strategies are shown and the respective advantages and disadvantages are highlighted.
DOE – practice-oriented, statistical test planning
The application of statistical test planning enables cost-efficient test planning for the determination of empirical models for process or service life analyzes. Therefore, in this you will get to know the necessary statistical basics for the application of DOE and an application guide for the implementation of your problem. At the end of the seminar there is a final exercise in which all participants independently plan the experiment, conduct the experiment and analyze the results.
Development and protection of electronic components
This basic seminar mainly addresses the challenges of ensuring the reliability of electronic components. Reference is also made to the problems in production as well as in commissioning and operation. Based on a systematic analysis, statistical bases for the analysis and the test strategies for the reliability assurance of electronic systems are discussed.
Didn’t find the right seminar for you? We adapt our in-house seminars and trainings to your individual needs on request – talk to us!